A wide variety of chiral non-collinear spin textures have been discovered and have unique properties that make them highly interesting for technological applications. However, many of these are found in complex materials and only in a narrow window of temperature. Here, we show the formation of Néel-type skyrmions in thin layers of simple ferromagnetic alloys, namely Co-Al and Co-Ni-Al, over a wide range of temperature up to ~773 K, by imposing a strain gradient perpendicular to the sample plane via epitaxy with an Ir-Al underlayer. The Néel skyrmions are directly observed using Lorentz transmission electron microscopy in freestanding membranes at high temperatures and the strain gradient is directly measured from x-ray diffraction asymmetric peak profiles. Our concept allows for simple centrosymmetric ferromagnets with high magnetic ordering temperatures to exhibit skyrmions at temperatures well above room temperature, thereby, bringing closer skyrmionic electronics.

High temperature Néel skyrmions in simple ferromagnets

Migliorini, Andrea;
2026

Abstract

A wide variety of chiral non-collinear spin textures have been discovered and have unique properties that make them highly interesting for technological applications. However, many of these are found in complex materials and only in a narrow window of temperature. Here, we show the formation of Néel-type skyrmions in thin layers of simple ferromagnetic alloys, namely Co-Al and Co-Ni-Al, over a wide range of temperature up to ~773 K, by imposing a strain gradient perpendicular to the sample plane via epitaxy with an Ir-Al underlayer. The Néel skyrmions are directly observed using Lorentz transmission electron microscopy in freestanding membranes at high temperatures and the strain gradient is directly measured from x-ray diffraction asymmetric peak profiles. Our concept allows for simple centrosymmetric ferromagnets with high magnetic ordering temperatures to exhibit skyrmions at temperatures well above room temperature, thereby, bringing closer skyrmionic electronics.
2026
17
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10278/5120248
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