Solid-state-biased coherent detection of ultra-broadband terahertz pulses

Significant progress in nonlinear and ultrafast optics has recently opened new and exciting opportunities for terahertz (THz) science and technology, which require the development of reliable THz sources, detectors, and supporting devices. In this work, we demonstrate the first solid-state technique for the coherent detection of ultra-broadband THz pulses (0.1-10 THz), relying on the electric-field-induced second-harmonic generation in a thin layer of ultraviolet fused silica. The proposed CMOS-compatible devices, which can be realized with standard microfabrication techniques, allow us to perform ultra-broadband detection with a high dynamic range by employing probe laser powers and bias voltages much lower than those used in gas-based techniques. Eventually, this may pave the way for the use of high-repetition-rate ultrafast lasers and commercially available electronics for the coherent detection of ultrashort THz pulses.