Two Cd(Se, S)-doped glasses, one richer in selenium and the other richer in sulphur, were examined by X-ray scattering (at high and at small angles) in order to determine with high precision the stoichiometry of the microcrystalline phase as well as the crystallite/particle average size and size distribution. The peak profile broadening analysis, carried out by best-fitting methods, has shown the presence of microstrains inside the dispersed crystalline particles. This result agrees with very recent HRTEM observations. Particle sizes, as determined by SAXS, are shown to agree very well with the corresponding ones determined by SANS.