Both SIMS and RBS techniques are used to obtain smooth accurate concentration profiles of silver diffused into soda‐lime glass systems. By a computer simulation, a combination of the two techniques enables more detailed information to be obtained on the silver distribution at a depth of up to several micrometres, and the concentration profiles can be used effectively for testing the reliability of some optical behaviour characterizations of glass waveguiding structures. Copyright © 1994 John Wiley & Sons Ltd.
SIMS-RBS DEPTH PROFILING OF SILVER-DIFFUSED GLASS SYSTEMS
GONELLA, Francesco;
1994-01-01
Abstract
Both SIMS and RBS techniques are used to obtain smooth accurate concentration profiles of silver diffused into soda‐lime glass systems. By a computer simulation, a combination of the two techniques enables more detailed information to be obtained on the silver distribution at a depth of up to several micrometres, and the concentration profiles can be used effectively for testing the reliability of some optical behaviour characterizations of glass waveguiding structures. Copyright © 1994 John Wiley & Sons Ltd.
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