The small-angle x-ray intensities scattered (SAXS) by four reversed phase silica (RPS) samples are analyzed. The RPS's have been obtained by coating two different porous silica supports with dimethyloctyl- and with dimethyloctadecyl-(chloro)silane. From the observed intensities it is possible to estimate the mean electron-densities of the films as well as the mean silica-surface per coating molecule.
SAXS study of coated porous silicas
BENEDETTI, Alvise;PINNA, Francesco;STRUKUL, Giorgio
1993-01-01
Abstract
The small-angle x-ray intensities scattered (SAXS) by four reversed phase silica (RPS) samples are analyzed. The RPS's have been obtained by coating two different porous silica supports with dimethyloctyl- and with dimethyloctadecyl-(chloro)silane. From the observed intensities it is possible to estimate the mean electron-densities of the films as well as the mean silica-surface per coating molecule.
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