A method for fitting X-ray line profiles has been devised for application to line broadening analysis. The approximation of the profile by pseudo-Voigt functions (sum of Lorentz and Gauss terms of equal width) has been explored in different cases which frequently occur in the characteriza-tion of materials by X-ray diffraction. It has been found that such an approximation is able to give satisfactory fittings of experimental data even in cases with severe overlapping of very broadened peaks. The procedure allows peak Separation and application of the Warren-Averbach method for determining crystallite size and strain, in cases that could not be considered meaningful before. The corrected Fourier coefficients are free from “hook” effect and allow determination of physical parameters within the ränge of information content of experimental data. © 1985, R. Oldenbourg Verlag. All rights reserved.
|Data di pubblicazione:||1985|
|Titolo:||Applications of fitting techniques to the Warren-Averbach method for X-ray line broadening analysis|
|Rivista:||ZEITSCHRIFT FUR KRISTALLOGRAPHIE. NEW CRYSTAL STRUCTURES|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1524/zkri.1985.170.1-4.275|
|Appare nelle tipologie:||2.1 Articolo su rivista |