The power of secondary ion mass spectrometry to determine smooth compositional profiles is applied to the study of ion-exchanged glass systems. In particular, it is shown how accurate measurements of the depth distribution of alkali ions can be used, together with other optical means, to recover refractive-index profiles of silver- and potassium-diffused waveguides which have only a few modes.

Secondary ion mass spectrometry applied to the study of ion-exchanged glass waveguides with a few modes

GONELLA, Francesco;
1994-01-01

Abstract

The power of secondary ion mass spectrometry to determine smooth compositional profiles is applied to the study of ion-exchanged glass systems. In particular, it is shown how accurate measurements of the depth distribution of alkali ions can be used, together with other optical means, to recover refractive-index profiles of silver- and potassium-diffused waveguides which have only a few modes.
1994
9
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10278/35312
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