The power of secondary ion mass spectrometry to determine smooth compositional profiles is applied to the study of ion-exchanged glass systems. In particular, it is shown how accurate measurements of the depth distribution of alkali ions can be used, together with other optical means, to recover refractive-index profiles of silver- and potassium-diffused waveguides which have only a few modes.
Secondary ion mass spectrometry applied to the study of ion-exchanged glass waveguides with a few modes
GONELLA, Francesco;
1994-01-01
Abstract
The power of secondary ion mass spectrometry to determine smooth compositional profiles is applied to the study of ion-exchanged glass systems. In particular, it is shown how accurate measurements of the depth distribution of alkali ions can be used, together with other optical means, to recover refractive-index profiles of silver- and potassium-diffused waveguides which have only a few modes.File in questo prodotto:
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