The parameters of functions used to predict diffusion controlled SECM approach curves under positive and negative (hindered diffusion) feedback for sphere-cap tips are reported. These functions were obtained by fitting approach curves simulated with an error bounded adaptive finite element algorithm. Several geometries corresponding to different sphere-cap dimensions were considered including the effect of the tip insulating sheath. The simulated approach curves were successfully compared with experimental ones obtained with mercury sphere-caps electrodeposited onto platinum microdisc electrodes.

Scanning electrochemical microscopy: Approach curves for sphere-cap SECM tips.

DANIELE, Salvatore
;
DE FAVERI, Eddy
2007-01-01

Abstract

The parameters of functions used to predict diffusion controlled SECM approach curves under positive and negative (hindered diffusion) feedback for sphere-cap tips are reported. These functions were obtained by fitting approach curves simulated with an error bounded adaptive finite element algorithm. Several geometries corresponding to different sphere-cap dimensions were considered including the effect of the tip insulating sheath. The simulated approach curves were successfully compared with experimental ones obtained with mercury sphere-caps electrodeposited onto platinum microdisc electrodes.
2007
79
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/10278/30117
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