Er-doped dielectric films are materials characterized by the emission of an intense photoluminescence signal at λ = 1.54 μm. The shape and intensity of the radiative emission of Er3+ ions may depend on the compositional and structural characteristics of the host dielectric matrix. With a suitable choice of the preparation parameters, we were able to synthesize luminescence dielectric thin films of crystalline alumina doped with erbium atoms by means of radiofrequency magnetron co-sputtering deposition. The samples were mainly characterized by X-ray diffraction, photoluminescence spectroscopy, and Rutherford backscattering spectrometry. The films show interesting changes of the 1.54 μm emission band shape as a function of the optical activation annealing temperature. © 2010 Elsevier B.V. All rights reserved.
Er-Doped Alumina Crystalline Films Deposited by Radiofrequency Magnetron co-Sputtering
CATTARUZZA, Elti;BATTAGLIN, Giancarlo;GONELLA, Francesco;RIELLO, Pietro;TRAVE, Enrico;
2011-01-01
Abstract
Er-doped dielectric films are materials characterized by the emission of an intense photoluminescence signal at λ = 1.54 μm. The shape and intensity of the radiative emission of Er3+ ions may depend on the compositional and structural characteristics of the host dielectric matrix. With a suitable choice of the preparation parameters, we were able to synthesize luminescence dielectric thin films of crystalline alumina doped with erbium atoms by means of radiofrequency magnetron co-sputtering deposition. The samples were mainly characterized by X-ray diffraction, photoluminescence spectroscopy, and Rutherford backscattering spectrometry. The films show interesting changes of the 1.54 μm emission band shape as a function of the optical activation annealing temperature. © 2010 Elsevier B.V. All rights reserved.File | Dimensione | Formato | |
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