A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 1020 Er cm-3. Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.
Doping of silicate glasses with erbium by a field-assisted solid-state ion exchange technique
CATTARUZZA, Elti;BATTAGLIN, Giancarlo;GONELLA, Francesco;TRAVE, Enrico
2009-01-01
Abstract
A field-assisted solid-state ion exchange technique is used for the first time to dope surface layers of silicate glasses with erbium at the concentration of the order of a few 1020 Er cm-3. Rutherford backscattering spectrometry, extended x-ray absorption fine structure spectroscopy and photoluminescence spectroscopy are used to characterize the samples treated after erbium oxide films were formed on soda-lime glass slides.
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